Vista normal
Vista MARC
ANALISIS DE PRODUCCION (Término temático)
Machine generated authority record.
Work cat.: (AR-LpUFI)8071: Ferris-Prabhu, Albert V. 279670, Introduction to semiconductor device yield modeling, 1992.
Machine generated authority record.
Work cat.: (AR-LpUFI)8071: Ferris-Prabhu, Albert V. 279670, Introduction to semiconductor device yield modeling, 1992.