Scanning electron microscopy and x-ray microanalysis / Goldstein, Joseph I... [et al.].

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Tipo de material: Texto

TextoDetalles de publicación: New York : Springer, 2003.Edición: 3td edDescripción: xix, 690 p. : figurasISBN:

9781461349693

Tema(s):

Alcance y contenido: Introduction - The SEM and its modes of operation - Electron beam-specimen interactions - Image formation and interpretation - Special topics in scanning electron microscopy - Generation of X-rays in the SEM specimen - X-ray spectral measurement: EDS and WDS - Qualitative X-ray analysis - Quantitative X-ray analysis: the basics - Special topics in electron beam X-ray microanalysis - Specimen preparation of hard materials: metals, ceramics, rocks, minerals, microelectronic and packaged devices, particles and fibers.

Tipo de ítem:

Libro

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Introduction - The SEM and its modes of operation - Electron beam-specimen interactions - Image formation and interpretation - Special topics in scanning electron microscopy - Generation of X-rays in the SEM specimen - X-ray spectral measurement: EDS and WDS - Qualitative X-ray analysis - Quantitative X-ray analysis: the basics - Special topics in electron beam X-ray microanalysis - Specimen preparation of hard materials: metals, ceramics, rocks, minerals, microelectronic and packaged devices, particles and fibers.

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