Echlin, Patrick.  <br/><br/>
Handbook of sample preparation for scanning electron microscopy and X-ray microanalysis /   
Patrick Echlin. 
 - New York :   Springer,   2010. 
 - 330 p. :   figuras, tablas 
<br/><br/> Introduction - Sample collection and selection - Sample preparation tools - Sample support - Sample embedding and mounting - Sample exposure - Sample dehydration - Sample stabilization for imaging in the SEM - Sample stabilization to preserve chemical identity - Sample cleaning - Sample surface charge elimination - Sample artifacts and damage - Additional sources of information. 
<br/><br/><label>ISBN: </label>9781441946744 
<br/><br/><label>Subjects--Topical Terms: </label><br/>MICROSCOPIA<br/>MICROANALISIS<br/>RAYOS X<br/>PREPARACION DE MUESTRAS<br/>MICROSCOPIA DE BARRIDO<br/>MANUALES
<br/><br/><label>Universal Decimal Class. No.: </label>57.086/.88