TY  - BOOK
AU  - Echlin,Patrick
TI  - Handbook of sample preparation for scanning electron microscopy and X-ray microanalysis /  
SN  - 9781441946744
PY  - 2010///
CY  - New York : 
PB  - Springer, 
KW  - MICROSCOPIA
KW  - MICROANALISIS
KW  - RAYOS X
KW  - PREPARACION DE MUESTRAS
KW  - MICROSCOPIA DE BARRIDO
KW  - MANUALES
N2  - Introduction - Sample collection and selection - Sample preparation tools - Sample support - Sample embedding and mounting - Sample exposure - Sample dehydration - Sample stabilization for imaging in the SEM - Sample stabilization to preserve chemical identity - Sample cleaning - Sample surface charge elimination - Sample artifacts and damage - Additional sources of information
ER  -