Scanning electron microscopy and x-ray microanalysis /   
Goldstein, Joseph I... [et al.]. 
 - 3td ed. 
 - New York :   Springer,   2003. 
 - xix, 690 p. :   figuras 
<br/><br/> Introduction - The SEM and its modes of operation - Electron beam-specimen interactions - Image formation and interpretation - Special topics in scanning electron microscopy - Generation of X-rays in the SEM specimen - X-ray spectral measurement: EDS and WDS - Qualitative X-ray analysis - Quantitative X-ray analysis: the basics - Special topics in electron beam X-ray microanalysis - Specimen preparation of hard materials: metals, ceramics, rocks, minerals, microelectronic and packaged devices, particles and fibers. 
<br/><br/><label>ISBN: </label>9781461349693 
<br/><br/><label>Subjects--Topical Terms: </label><br/>MICROANALISIS<br/>MICROSCOPIA<br/>RAYOS X<br/>PREPARACION DE MUESTRAS<br/>MICROSCOPIA DE BARRIDO
<br/><br/><label>Universal Decimal Class. No.: </label>57.086/.088