TY  - BOOK
AU  - Goldstein,Joseph I.
AU  - Newbury,Dale E.
AU  - Echlin,Patrick
AU  - Joy,David C.
AU  - Lyman,Charles E.
AU  - Lifshin,Eric
AU  - Sawyer,Linda
AU  - Michael,Joseph R.
TI  - Scanning electron microscopy and x-ray microanalysis /  
SN  - 9781461349693
PY  - 2003///
CY  - New York : 
PB  - Springer, 
KW  - MICROANALISIS
KW  - MICROSCOPIA
KW  - RAYOS X
KW  - PREPARACION DE MUESTRAS
KW  - MICROSCOPIA DE BARRIDO
N2  - Introduction - The SEM and its modes of operation - Electron beam-specimen interactions - Image formation and interpretation - Special topics in scanning electron microscopy - Generation of X-rays in the SEM specimen - X-ray spectral measurement: EDS and WDS - Qualitative X-ray analysis - Quantitative X-ray analysis: the basics - Special topics in electron beam X-ray microanalysis - Specimen preparation of hard materials: metals, ceramics, rocks, minerals, microelectronic and packaged devices, particles and fibers
ER  -