Leng, Yang.  <br/><br/>
Materials characterization :   introduction to microscopic and spectroscopic methods /  
Yang Leng. 
 - 2nd ed. 
 - Weinheim :   Wiley-VCH,   2013. 
 - xiv; 376 p. :   figuras 
<br/><br/> Ligh microscopy - X-Ray diffraction methods - Transmission electron microscopy - Scanning electron microscopy - Scanning probe microscopy - X-Ray spectroscopy for elemental analysis - Electron spectroscopy for surface analysis - Secondary ion mass spectrometry for surface analysis - Vibrational spectroscopy for molecular analysis - Thermal analysis. 
<br/><br/><label>ISBN: </label>9783527334636 
<br/><br/><label>Subjects--Topical Terms: </label><br/>RAYOS X<br/>MICROSCOPIA<br/>ESPECTROSCOPIA
<br/><br/><label>Universal Decimal Class. No.: </label>57.086/.088