TY  - BOOK
AU  - Leng,Yang
TI  - Materials characterization : : introduction to microscopic and spectroscopic methods / 
SN  - 9783527334636
PY  - 2013///
CY  - Weinheim : 
PB  - Wiley-VCH, 
KW  - RAYOS X
KW  - MICROSCOPIA
KW  - ESPECTROSCOPIA
N2  - Ligh microscopy - X-Ray diffraction methods - Transmission electron microscopy - Scanning electron microscopy - Scanning probe microscopy - X-Ray spectroscopy for elemental analysis - Electron spectroscopy for surface analysis - Secondary ion mass spectrometry for surface analysis - Vibrational spectroscopy for molecular analysis - Thermal analysis
ER  -