Brandon, David.  <br/><br/>
Microstructural characterization of materials /   
David Brandon; Wayne D. Kaplan. 
 - 2nd ed. 
 - West Sussex :   John Wiley and Sons,   2008. 
 - xiv; 536 p. :   figuras 
<br/><br/> The concept of microstructure - Diffraction analysis of crystal structure - Optical microscopy - Transmission electron microscopy - Scanning electron microscopy - Microanalysis in electron microscopy - Scanning probe microscopy and related techniques - Chemical analysis of surface composition - Quantitative and tomographic analysis of microstructure - Appendices. 
<br/><br/><label>ISBN: </label>9780470027851 
<br/><br/><label>Subjects--Topical Terms: </label><br/>MICROESTRUCTURAS<br/>MICROSCOPIA OPTICA<br/>MICROSCOPIA ELECTRONICA<br/>MATERIALES
<br/><br/><label>Universal Decimal Class. No.: </label>620.2